Summary
Measurement of fast voltage transients is necessary in many fields of electrical engineering and the voltage transients come with different types of waveforms and voltage amplitudes. The technical brochure deals with high-voltage transients with transient peak voltages in the range of a few kilovolts to hundreds of kilovolts, with typical rise time in the range of a few nanoseconds to a fraction of a microsecond, many of which are used in testing high-voltage products in accordance with IEC and other international standards.
This Technical Brochure provides a review of techniques for traceable measurements of these transients and associated calibration methods and services that are currently available. Results of an international comparison measurements are reported. It is concluded that currently achievable measurement uncertainties are adequate for the purposes of performing the associated fast transient tests on products. The techniques and conclusions reported in this brochure may be used in revision of the relevant IEC standards involving measurement of fast voltage transients.
Table of content
1. Introduction
1.1. Summary of fast transients defined in IEC standards
1.2. Reference for chapter 1
2. Measurement of Very Fast Transient Overvoltage (VFTO) in High-Voltage Equipment
2.1. VFTO and VFT waveforms
2.2. Sensors for measuring VFTOs
2.3. Calibration of VFTO sensors
2.4. References of chapter 2
3. Short-front Impulses for Impulse Puncture Testing of Ceramic/Glass Insulators
3.1. Impulse puncture testing and relevant IEC standard
3.2. Test circuit and waveforms
3.3. Measurement of the puncture test short-front impulse voltage
3.4. International comparison of measurement systems for impulse puncture tests
3.5. Traceability and calibration of the short-front impulse voltage measurement
3.6. References for chapter 3
4. Steep-front Impulses for Testing Polymer Composite Insulators
4.1. Relevant IEC standard and test procedure
4.2. Test waveform to measure
4.3. Traceability and calibration of the measurement system
4.4. Reference for chapter 4
5. Fast-front Impulses for Testing Stator Coils of Rotating Machines
5.1. Relevant standards and test waveforms
5.2. Measurement systems and measurement traceability
5.3. References for chapter 5
6. Electrical Fast Transient (Burst) for Immunity Testing of Electronic Devices
6.1. Relevant standards and test waveforms
6.2. Calibration of test system
6.3. Measurement traceability
6.4. References for chapter 6
7. Requirements for Testing Instrument Transformers with Transmitted Overvoltages
7.1. Transmitted overvoltage of voltage transformers
7.2. Transmitted overvoltage of a current transformer
7.3. References for chapter 7
8. Conclusion
APPENDIX A. Step Response Deconvolution Techniques for Fast Transient Measurement
A.1. Theoretical considerations about deconvolution
A.2. Step response and convolution
A.3. Practical considerations about deconvolution
A.4. References for annex A
Additional informations
| Publication type | Technical Brochures |
|---|---|
| Reference | 1002 |
| Publication year | |
| Publisher | CIGRE |
| ISBN | 978-2-85873-707-9 |
| Study committees | |
| Working groups | WG D1.60 |
| File size | 5 MB |
| Pages number | 63 |
| Price for non member | 130 € |
| Price for member | Free |
Authors
Yi Li, Convenor (AU), Jari Hällström, Secretary (FI)
Anders Bergman (SE), Alf-Peter Elg (SE), Ricardo Diaz (AR), Orsino Borges Filho (BR), Fernando Garnacho (ES), Joni Kluss (SE), Willian Larzelere (US), Guoming Ma (CN), Johann Meisner (DE), Johannes Rickmann (DE), Shigemitsu Okabe (JP), Haiming Shao (CN), Takayuki Wakimoto (JP), Wei Yan (AU)
Keywords
Fast transient, steep-front impulse, short-front impulse, very fast transient overvoltage, traceable measurement
